31 May 2010 to 2 June 2010
Barcelona
Europe/Zurich timezone

Evaluation of fluence dependent variations of capacitance and generation current parameters by transient technique

31 May 2010, 11:40
20m
Barcelona

Barcelona

Residencia CSIC, Carrer Hospital, 64.

Speaker

Dr Eugenijus Gaubas (Inst. of Applied Research Vilnius University)

Description

Evaluation of fluence dependent variations of capacitance and generation current parameters by transient technique E.Gaubas, T.Ceponis, A.Uleckas, S.Sakalauskas, and J.Vaitkus A transient technique for barrier evaluation by linearily increased voltage (BELIV) is presented. Variations of current transients under reverse and forward LIV biased pad-detectors, irradiated by reactor neutrons with fluences in the range of 10^12 -10^16 cm^-2, are analyzed. Correlations between the BELIV and impedance based C-V measurements are discussed.

Author

Dr Eugenijus Gaubas (Inst. of Applied Research Vilnius University)

Presentation materials