16th RD50 Workshop (Barcelona)

Details for Eugenijus Gaubas

Title: Dr

Affiliation: Inst. of Applied Research Vilnius University

Author in the following contributions

• Study of dominant recombination defects by fluence dependent variations of carrier lifetimes and drift parameters in MCZ Si wafers and pad-detectors
• Evaluation of fluence dependent variations of capacitance and generation current parameters by transient technique