16th (Virtual) "Trento" Workshop on Advanced Silicon Radiation Detectors

A Data-Driven of Test beam related LGAD mortality

18 Feb 2021, 10:20

20m

FBK, Trento

Oral LGAD Session 9: LGAD 2

Speaker

Dr Vagelis Gkougkousis (CERN)

Description

Using test-beam data on 80-120 GeV pion beams, a study of LGAD mortality is presented for neutron and proton irradiated samples for fluences up to 6e15n${}_{eq}$/cm${}^2$. An empirical model is established for estimating maximum safe operating voltage point and a link is demonstrated between bias voltage and beam-related damage. Comparisons are performed with similar operating points at laboratory conditions and a link with incoming particle rate is debated. Macroscopic and microscopic inspection of damaged devices is also presented with an emphasis on non-handling related incidents.

Presentation materials

Talk recording

Trento Mortality Studies.pdf