Speaker
Dr
Vagelis Gkougkousis
(CERN)
Description
Using test-beam data on 80-120 GeV pion beams, a study of LGAD mortality is presented for neutron and proton irradiated samples for fluences up to 6e15n$_{eq}$/cm$^{2}$. An empirical model is established for estimating maximum safe operating voltage point and a link is demonstrated between bias voltage and beam-related damage. Comparisons are performed with similar operating points at laboratory conditions and a link with incoming particle rate is debated. Macroscopic and microscopic inspection of damaged devices is also presented with an emphasis on non-handling related incidents.
Primary authors
Dr
Vagelis Gkougkousis
(CERN)
Victor Coco
(CERN)
