Conveners
Radiation-Tolerant Components and Systems
- Alessandro Cardini (INFN Cagliari, Italy)
Radiation-Tolerant Components and Systems
- Hucheng Chen (Brookhaven National Laboratory (US))
Early measurements on monolithic pixel sensor prototypes in the TPSCo 65nm technology indicate a different response and radiation tolerance (up to $5\times10^{15}~1\text{MeV}~\text{n}_{\text{eq}}/\text{cm}^2$) for different sensor layout and process variants, illustrating the importance of layout and process in the path towards increased sensor radiation tolerance. Using these measurement...
In the context of the Strategic R&D on Technologies for Future Experiments, the sensitivity to single-event-effects of a commercial 28nm CMOS technology was investigated through heavy-ion and proton tests. Two chips were designed to study single- and multi-bit-upset, single-event-transient and single-event-latch-up. Bit upsets were studied on both D-Flip-Flops and foundry SRAMs. LET of heavy...
The radiation hardness of transistors in a 22nm Fully Depleted Silicon-On-Insulator (FDSOI) technology exposed to ultra-high total ionizing dose (TID) was investigated. Custom structures including n- and p-channel devices with different sizes and threshold voltage flavours were irradiated with X-rays up to a TID of 100 Mrad(SiO2 ) with different back-gate bias configurations, up to 2 V. The...
The electronic systems at CERN, exposed to the harsh radiation environments of particle accelerators and experiments, require specific qualification procedures to ensure reliability under radiation. A large number of distributed systems, thermal neutron fluences in shielded areas, and spectra composed mainly of neutrons are some of the unique challenges that the LHC presents. CERN has...
The CHARM Radiation Tolerant Tester Board (CRATEBO) is a testing platform for the CERN High-energy Accelerator (CHARM) irradiation facility. It is meant to ease the radiation testing of FPGA-based systems by providing users with a radiation-tolerant carrier card for the Device Under Test (DUT). It provides a high-speed communication interface, a flexible power supply, and DUT connections via a...
