Speaker
Description
The emissivity of low-temperature materials exhibits variations with changes in temperature. Currently, measuring low-temperature emissivity often includes the use of cryogenic liquids like liquid nitrogen and liquid helium, which presents challenges such as handling inconvenience and limited adaptability to a broad temperature range. Furthermore, materials like aluminum-coated polyester films exhibit surface emissivity levels lower by several orders of magnitude compared to materials like copper and stainless steel, presenting significant challenges in achieving high-precision measurements. In this study, a low-temperature emissivity testing apparatus based on a pulse tube cryocooler has been developed. The measurement temperature range extends from 50 K to room temperature, and with the option to change the cryocooler, measurements at even lower temperatures, such as 4 K to room temperature, can be achieved. The measurement principles and crucial structural elements of the developed testing apparatus, specifically designed for low emissivity samples, will be introduced. Additionally, experimental measurement results for various samples at different temperatures will also be presented.
| Submitters Country | China |
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