28 June 2026 to 2 July 2026
Ghent, Belgium
Europe/Brussels timezone

ColorPix-3: A Step Forward in Advanced Spectral X-ray Imaging

29 Jun 2026, 17:10
20m
Foyer (Coupure Blok E)

Foyer

Coupure Blok E

Poster presentation only Applications Poster session 1

Speakers

Jan Broulim (Czech Technical University in Prague (CZ)) Karolina Lavickova (Czech Technical University in Prague (CZ))

Description

The ColorPix ASIC, currently in its third revision, is a hybrid pixel detector designed for spectral X-ray imaging. It is implemented in 65 nm CMOS technology and features a 32 × 32 pixel matrix, with scalability toward future expansion up to 256 × 256 pixels. The pixel pitch is 70 µm. A 2 mm-thick CZT (cadmium zinc telluride) sensor layer, which is highly sensitive to X-rays, is bump-bonded to the chip. The detector operates in photon-counting mode, acquiring data across 10 configurable energy bins using 12-bit counters. Compared to traditional imaging detectors, this approach significantly enhances material composition analysis capabilities. In this work, we present the first measurements obtained with the ColorPix-3 chip, along with selected simulation results.

Authors

Jan Broulim (Czech Technical University in Prague (CZ)) Karolina Lavickova (Czech Technical University in Prague (CZ)) Lukas Tomasek (Czech Technical University in Prague (CZ)) Maria Marcisovska (Czech Technical University in Prague (CZ)) Michal Marcisovsky (Czech Academy of Sciences (CZ)) Monika Kuncova (Czech Technical University in Prague (CZ)) Peter Svihra (Czech Academy of Sciences (CZ), Czech Technical University in Prague (CZ)) Radek Novotny (Czech Technical University in Prague (CZ)) Zdenko Janoska (Czech Technical University in Prague (CZ))

Presentation materials

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