Speaker
Prof.
Juozas Vaitkus
(Vilnius University)
Description
The light pulse excited microwave conductivity decay method for surface recombination rate measurement is presented. The preliminary results are performed in the differently passivated silicon samples surface.
Primary author
Dr
Eugenijus Gaubas
(Vilnius university)
Co-authors
Mr
Audrius Tekorius
(Faculty of Physics, Vilnius University)
Hartmut Sadrozinski
(SCIPP, UC santa Cruz)
Prof.
Juozas Vaitkus
(Vilnius University)
Dr
Tomas Ceponis
(Institute of Applied research, Vilnius University)
Vitaliy Fadeyev
(U)
