Speaker
Vitaliy Fadeyev
(University of California,Santa Cruz (US))
Description
We are pursuing a “slim edge” technology which allows a drastic reduction of inactive region along the perimeter of silicon detectors. Such reduction would benefit construction of large-area tracker and imaging systems. Key components of this method are surface scribing, cleaving, and passivation of the resulting sidewall. We will give a short overview of the project and describe recent progress on the manufacturing technology and device studies. The latter includes charge collection near the edge and irradiation studies.
Primary authors
Hartmut Sadrozinski
(SCIPP, UC santa Cruz)
Vitaliy Fadeyev
(University of California,Santa Cruz (US))
Co-authors
Dr
Andrew Blue
(University of Glasgow)
Anna Macchiolo
(Max-Planck-Institut fuer Physik (Werner-Heisenberg-Institut) (D)
Colin Parker
(SCIPP, UCSC)
Dario Pellegrini
(Ecole Polytechnique Federale de Lausanne (CH))
Prof.
Gian-Franco Dalla Betta
(INFN and University of Trento)
Giulio Pellegrini
(Universidad de Valencia (ES))
Jeffrey Ngo
(SCIPP, UCSC)
Joan Marc Rafi
(CNM)
Dr
Miguel Ullan Comes
(Universidad de Valencia (ES))
Richard Bates
(University of Glasgow (GB))
Victor Hugo Benitez Casma
(Universidad de Valencia (ES))
Mr
Zachary Galloway
(SCIPP, UCSC)
