Speaker
Ulrich Parzefall
(Albert-Ludwigs-Universitaet Freiburg (DE))
Description
We evaluate the long term evolution of the charge multiplication effect found in some sensors. This procedure is intended to test operation under realistic LHC conditions, such as exposure to extreme bias voltages for many days, bias voltage cycling, and running at very low temperature. We aim to understand if charge multiplication may be usefully relied upon for HL-HLC operation, or if it turns out to be a short-term benefit.
Author
Ulrich Parzefall
(Albert-Ludwigs-Universitaet Freiburg (DE))
Co-authors
Christopher Betancourt
(Albert-Ludwigs-Universitaet Freiburg (DE))
Karl Jakobs
(Albert-Ludwigs-Universitaet Freiburg (DE))
Kristin Lohwasser
(Deutsches Elektronen-Synchrotron (DE))
Riccardo Mori
(Albert-Ludwigs-Universitaet Freiburg (DE))
Susanne Kuehn
(Albert-Ludwigs-Universitaet Freiburg (DE))
