Sep 25 – 29, 2006
Valencia, Spain
Europe/Zurich timezone

Radiation Testing of electronic components and systems for the LHC experiments and machine : summary and future

Sep 27, 2006, 4:20 PM
1h 40m
Valencia, Spain

Valencia, Spain

IFIC – Instituto de Fisica Corpuscular Edificio Institutos de Investgación Apartado de Correos 22085 E-46071 València SPAIN

Speaker

Thijs Wijnands (CERN)

Description

A statistical summary on 6 years radiation testing for the LHC machine and experiments will be presented. The data shows that radiation tolerance assurance to cumulative damage effects was taken into account as an engineering constraint in a rather early stage in the project. The issue of Single Event Errors was only recognized as major issue at a much later stage in the project and this resulted in a sharp increase in proton beam testing in dedicated facilities at Université Catholique de Louvain and the Paul Scherrer Institute. Presently, the requests for dedicated radiation testing are reducing because series produced electronic equipment is being installed in the LHC. However, the requests may well rise again when the R&D for radiation hard semiconductor devices for the LHC upgrade gets to full swing. The suitability of the presently used radiation facilities for this task will be assessed.

Primary authors

Presentation materials