USCMS Phase-2 Forward Muon Upgrade Workshop

Electronics Radiation Hardness and On-Chamber Electronics Control

7 Dec 2016, 16:35

25m

M102 (Mitchell Institute for Fundamental Physics, Texas A&M University)

Technical Review

Speaker

Mikhail Matveev (Rice University (US))

Description

CCB path for the slice test, eprom issues, past experiences and considerations for future electronics testing

Presentation materials

Xilinx_EPROMS_12_2016.pdf

Slides

GEM_Rice_12_2016.pdf