LIU-PS Beam Dynamics WG meeting #17 - Emittance growth due to misteering and evolution at flat-bottom; KFA45 post-pulse ripple; PSB-to-PS dedicated MDs; High-intensity tests with 25 ns LHC-type beam; Status of PS turn-by-turn SEMgrid measurements
AOB: Status of PS turn-by-turn SEMgrids measurements (reliability run, usage of the present electronics for turn-by-turn measurements, status of the new turn-by-turn electronics development)30m
Reliability run results on kickers pulses for beam destruction (M. Fraser, 10 mins)
Usage of the present electronics for turn-by-turn measurements (F. Tecker, 10 mins)
Status of the new turn-by-turn electronics development (F. Roncarolo, 10 mins)
Speakers:
Matthew Alexander Fraser(CERN), Frank Tecker(CERN), Federico Roncarolo(CERN)