22–27 Sept 2019
Hyatt Regency Hotel Vancouver
Canada/Pacific timezone

Thu-Af-Or24-04: "Thermal Eraser” to Mitigate Screening Current by Optimal Control on Temperature in an HTS Pancake Coil

26 Sept 2019, 17:30
15m
Regency EF

Regency EF

Speaker

Jeseok Bang (Seoul National University)

Description

This paper presents a method to mitigate screening current by manipulating temperature in a high temperature superconductor (HTS) pancake coil. Named as “Thermal Eraser”, it utilizes an electric heater that is optimally designed to “create” a target temperature profile in the HTS pancake coil. The key idea is to control field and temperature dependent critical current Ic (B,T) of “individual” turns in the HTS coil by an optimal operation of the heater, i.e., Thermal Eraser. Here we report: (1) principle of operation; (2) design of an electric heater that is dedicated to an REBCO test pancake coil; (3) construction and operation of the heater to demonstrate the feasibility of Thermal Eraser experimentally.

Acknowledgement
This work was supported by Samsung Research Funding & Incubation Center of Samsung Electronics under Project Number SRFC-IT1801-09.

Primary author

Jeseok Bang (Seoul National University)

Co-authors

Mr Jaemin Kim (Seoul National University) Uijong Bong (Seoul National University) Jung Tae Lee (Seoul National University) Soobin An (SeoulNationalUniversity) Chaemin Im (Seoul National University) Jeonghwan Park (Seoul National University) Seong Hyeon Park (Seoul National University) So Noguchi (Hokkaido University) Seungyong Hahn (Seoul National University)

Presentation materials