22–27 Sept 2019
Hyatt Regency Hotel Vancouver
Canada/Pacific timezone

Thu-Mo-Po4.05-06 [36]: Intra-wire resistance and AC loss of multi-filamentary Bi2212 round wire

26 Sept 2019, 08:45
2h
Level 2 Posters 1

Level 2 Posters 1

Speaker

Prof. Chao Zhou (Institute of Plasma Physics, Chinese Academy of Sciences, Hefei, Anhui, China )

Description

A quantitative knowledge of the intra-wire transverse resistance is essential for a proper characterization of multi-filamentary Bi2212 round wires, and a better understanding of their performance in short sample tests and thus inter-strand current redistribution in cabled conductors.
Intra-wire resistance and AC loss of various multi-filamentary Bi2212 round wires have been measured and analyzed. Two particular four-probe voltage–current methods are developed to measure the transverse intra-wire resistance distribution directly under various temperatures. The AC loss is acquired by both vibrating sample magnetometer (VSM) and magnetization measurements in a wide range of temperatures. With the aid of finite element method simulations, the filament-to-matrix contact resistance and effective transverse resistivity are derived from direct intra-wire resistance measurements. The effective transverse resistivity values are in good agreement with those analytically derived from the AC coupling loss measurements.
Here, we present the results of the experiments and simulations, and demonstrate how the extracted characteristic parameters provide a better insight into the current flow patterns within the wires.

Authors

Prof. Chao Zhou (Institute of Plasma Physics, Chinese Academy of Sciences, Hefei, Anhui, China ) Prof. Jinggang Qin (Institute of Plasma Physics, Chinese Academy of Sciences, Hefei, Anhui, China ) Dr Peng Gao (University of Twente) Prof. Jiangang Li (Institute of Plasma Physics, Chinese Academy of Sciences, Hefei, Anhui, China )

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