22–27 Sept 2019
Hyatt Regency Hotel Vancouver
Canada/Pacific timezone

Wed-Af-Po3.22-02 [80]: Effect of Specimen Shape on Eddy Current Distribution in Large Single Sheet Tester

25 Sept 2019, 14:00
2h
Level 2 Posters 2

Level 2 Posters 2

Speaker

Yongjian Li (Hebei University of Technology)

Description

Laminated silicon steel sheet, which is widely applied in electrical engineering, such as cores of power transformer and electrical machines, usually suffer from stress caused by a quantity of factors such as non-uniform clamping forces, wavy laminations, or temperature gradients. Therefore, the measurement of magnetic properties under stress is important. A remarkable number of works demonstrate that the large single sheet tester (SST) is suitable for applying stress and the problems related to the large SST are discussed in detail. However, the development of large SST is restricted by the defect that the systematic error was high and, in the worst case, reach up to 28%, which is attributed to the flux penetration into the specimen causes additional eddy current loops closing in the specimen’s plane. In this paper, the effect of specimen shape on eddy current distribution in large SST are mainly evaluated by numerical analysis and experimental comparison of different shapes of cross-shape specimen under various yoke constructions. The additional eddy current closed loops in the specimen’s plane will be cut off by the means of slotting in the specimen. Three kinds of SST construction are applied to test different shapes of samples and losses of each specimen are compared and analyzed. The results demonstrates that slotting is beneficial to decrease the additional eddy current loss and increase the measurement accuracy.

Primary authors

Mr Yu Dou (State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology) Yongjian Li (Hebei University of Technology) Prof. Jianguo Zhu (School of Electrical and Information Engineering, University of Sydney) Dr Shuaichao Yue ( State Key Lab of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology) Dr Changgeng Zhang (State Key Laboratory of Reliability and Intelligence of Electrical Equipment,School of Electrical Engineering, Hebei University of Technology)

Presentation materials