22–27 Sept 2019
Hyatt Regency Hotel Vancouver
Canada/Pacific timezone

Mon-Af-Po1.11-10 [10]: Screen-Current Overstressing of REBCO Coil: An Experimental and Analytical Study with Small REBCO Coils

23 Sept 2019, 14:30
2h
Level 2 Posters 1

Level 2 Posters 1

Poster Presentation Mon-Af-Po1.11 - HTS Magnets II

Speaker

Dongkeun Park (Massachusetts Institute of Technology)

Description

Screening currents (SC) induced by varying magnetic fields may not only affect the field quality but also cause overstressing of REBCO coated conductor coils, making it a critical issue for NMR and other high-field magnets. We present in this paper results of an experimental and analytical study, performed with small REBCO pancake coils, on SC-overstressing of REBCO coil. Because SC is presumed to increase with REBCO tape width, we have studied test coils of two widths. The terminals of each coil, φ240 mm, were joined with a resistance sufficiently low to maintain the induced current constant enough during data taking. We use a 5-T/300-mm room-temperature bore magnet to not only supply an external field, but also induce up to 1000-A current to each coil at 4.2 K. Our experiment and analysis have demonstrated, and quantified, that the greater the REBCO tape width, the severer the SC-overstressing in REBCO coil will be.

Acknowledgement: Research reported in this publication was supported by the National Institute of General Medical Sciences of the National Institutes of Health under award number 5R01GM114834-13

Authors

Yi Li (Francis Bitter Magnet Laboratory/Plasma Science and Fusion Center, Massachusetts Institute of Technology) Dongkeun Park (Massachusetts Institute of Technology) Dr Yoonhyuck Choi (Francis Bitter Magnet Laboratory/Plasma Science and Fusion Center, Massachusetts Institute of Technology, Cambridge, MA 02139) Juan Bascuñàn (Francis Bitter Magnet Laboratory/Plasma Science and Fusion Center, Massachusetts Institute of Technology) Yukikazu Iwasa

Presentation materials