Oct 21 – 25, 2019
Europe/Warsaw timezone
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Analyzing the thermal images taken by Fluke TiS20 thermal imager

Oct 25, 2019, 1:45 PM
Centrum Zaawansowanych Materiałów i Technologii CEZAMAT

Centrum Zaawansowanych Materiałów i Technologii CEZAMAT

Poleczki 19, 02-822 Warszawa, Polska
TeFeNICA Student's Session TeFeNICA Session


Filip Protoklitow


Overheating electronic elements can causes them to function improperly, because of that measuring and controlling the temperature are major factors in terms of their longevity and reliability. Measurements can be done in discrete approach by using thermometers or by taking images using thermal imager and then analyzing them. In case of utilizing second approach it is easier to measure variety of subsystems in vastly reduced time, without necessity to setup whole array of apparatuses. By writing versatile MATLAB program I was able to analyze thermal images that can be used to investigate overheating elements, mean temperature and prepare graphs that can be used in future thermal analysis such as CFD simulations.

Primary author


Michalina Milewicz-Zalewska (Joint Institute for Nuclear Reactions) Daniel Dabrowski (Warsaw University of Technology) Marek Peryt (Warsaw University of Technology) Krystian Roslon (Warsaw University of Technology (PL)) Nikita Dunin (JINR) Maciej Czarnynoga (Politechnika Warszawska) Marcin Bielewicz (Nacional Centre for Nuclear Research)

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