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09:00
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Early Stage Researchers' Presentations
-
Norbert Wermes
(University of Bonn (DE))
(until 10:15)
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|
09:00
|
Characterization of depleted monolithic active pixel sensors with a column-drain read-out architecture in CMOS technologies
-
Ivan Dario Caicedo Sierra
(University of Bonn (DE))
|
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09:25
|
Pixel Sensor Development for High Radiation Environments in Modern CMOS Technologies
-
Konstantinos Moustakas
(University of Bonn (DE))
|
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09:50
|
Effects of program time on Sidewall Spacer data retention with respect to Total Ionizing Dose
-
Tommaso Vincenzi
(ams AG)
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10:15
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--- Coffee Break ---
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10:35
|
Early Stage Researchers' Presentations
-
Petra Riedler
(CERN)
Heinz Pernegger
(CERN)
(until 14:25)
|
|
11:05
|
Characterisation of radiation-hard X-ray sensors for medical applications
-
Filip Segmanovic
(ams AG)
|
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11:30
|
Design and timing characterization of radiation-hard circuits for monolithic sensors
-
Francesco Piro
(CERN)
|
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11:55
|
Effect of total ionizing dose on CMOS pixel sensors
-
Lluis Simon Argemi
(University of Glasgow (GB))
Lluis Simon Argemi
(University of Glasgow)
|
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12:20
|
--- Lunch ---
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|
13:35
|
Characterization of high voltage CMOS pixel sensor prototypes
-
Ettore Zaffaroni
(Universite de Geneve (CH))
|
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14:00
|
Advances on integration of Monolithic Silicon Sensors in Pixel Trackers
-
Roberto Cardella
(CERN)
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