Nov 15 – 19, 2021
Fukuoka Convention Center
Asia/Tokyo timezone

Inter-wire contact force induced critical current degradation of Bi-2212/Ag round wires reacted with and with no pre-pressure

WED-PO2-610-05
Nov 17, 2021, 10:30 AM
2h
Fukuoka Convention Center

Fukuoka Convention Center

Speaker

Peng Gao (Institute of Plasma Chinese Academy of Sciences)

Description

Bi-2212/Ag round wires are promising conductor candidates for the development of high-field magnets up to 25 T. With very high upper critical magnetic field and critical current density, Cable-In-Conduit Conductor (CICC) comprised of Bi-2212/Ag superconducting wires is under designing for the central solenoid coils of the China Fusion Engineering Test Reactor (CFETER). The current degradation due to the inter-wire contact force is a key issue that required to be reduced. However, the relevant publications for Bi-2212/Ag superconducting round wires are very limited to our knowledge. In this paper, the critical current degradation of Bi-2212 round wires due to inter-wire contact force are studied at 4.2 K in a background magnetic field up to 14 T. The crossover straight wires are pressed, and reacted together with other un-pressed wires, the wire samples are reacted with and with no pre-pressure for comparison. The inter-wire contact force dependence of critical current of these wires are then investigated under various crossover angles.

Primary authors

Peng Gao (Institute of Plasma Chinese Academy of Sciences) Dongsheng Yang (Institute of Plasma Physics Chinese Academy of Sciences) Haihong Liu (Institute of Plasma Physics Chinese Academy of Sciences) Chao Zhou ( Institute of Plasma Physics, Chinese Academy of Sciences) fang Liu Huajun Liu (Chinese Academy of Sciences) Jiangang Li (Institute of Plasma Physics Chinese Academy of Sciences) Jinggang Qin

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