17–19 Nov 2021
ADEIT
Europe/Zurich timezone

Soft X-Ray Low Gain Avalanche Detectors with 55um pitch for Imaging Applications using Timepix4 ASIC

19 Nov 2021, 09:10
20m
ADEIT

ADEIT

Plaza Virgen de la Paz, 3. 46001 Valencia, Spain

Speaker

Neil Moffat (Consejo Superior de Investigaciones Cientificas (CSIC) (ES))

Description

The AC-LGAD technology has been shown to be a very promising technology within HEP due to it's extremely good time resolution and 100% fill factor. This technology is proposed to be used with the Timepix4 ASIC for imaging applications using soft X-rays. The fabrication of these devices is underway. Simulation studies have been performed to optimize the technology for a 55um pixel pitch and a radiation damage study has been performed in order to understand the performance of these devices within HEP experiments and to study the surface damage effects for soft-x-ray detection.

Primary authors

Giulio Pellegrini (Centro Nacional de Microelectrónica (IMB-CNM-CSIC) (ES)) Jairo Antonio Villegas Dominguez (Consejo Superior de Investigaciones Cientificas (CSIC) (ES)) Neil Moffat (Consejo Superior de Investigaciones Cientificas (CSIC) (ES))

Presentation materials