University of California,Santa Cruz (US)
Author in the following contributions
- Analysis of MOS capacitor with p layer with TCAD simulation
- Identification and Recovery of ATLAS18 Strip Sensors with High Surface Static Charge
- TCAD simulation of the electrical performance of the ATLAS18 strip sensor for the HL-LHC
- Curing early breakdown in silicon strip sensors with radiation
- Analysis of the results from Quality Control tests performed on ATLAS18 Strip Sensors during on-going production
- Defect level identification of ATLAS ITk Strip Sensors using DLTS
- Long-term humidity exposure of ATLAS18 ITk strip sensors
- Hot spot visual evaluation of breakdown locations in ATLAS18 ITk strip sensors and test structures
