Speaker
Description
In preparation for the forthcoming High-Luminosity phase of the Large Hadron Collider, the ATLAS experiment is working on major upgrades to its detector systems to effectively accommodate the increase in radiation levels and track density. The foremost among these upgrades is the replacement of the current Inner Detector with the Inner Tracker (ITk).
The ITk consists of a Pixel Detector close to the beamline surrounded by a Strip Detector, which is made up of silicon strip modules. The silicon strip modules are operated at a bias voltage of up to 500V to ensure a 10:1 signal-to-noise ratio. Characterizing the electrical properties of such modules at different stages of the assembly procedure is crucial
to evaluating module performance. Of particular importance is detection of early breakdown, where current increases exponentially with increasing bias voltage below the 500V threshold mandated by the ITk Quality Control protocols.
This poster presents results from an irradiation campaign to investigate potentially beneficial effects of gamma irradiation on modules showing an early breakdown after gluing. In particular, one of the modules subjected to examination features the presence of adhesive on the sensor guard ring, which is known to cause premature breakdown. Modules were exposed to an ionizing dose of 11 krad (corresponding to the dose accumulated after several days of operation in the HL-LHC) utilizing a 60 Co source. Preliminary findings suggest a discernible improvement in the breakdown voltage. These results mark a significant step towards establishing a reliable pattern of component recovery during detector operation.
