Ionisation Profile Monitor simulation kickoff workshop

13/3-005 (CERN)



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Ionisation Profile Monitors are used to image the beam in transverse dimension using products of rest gas ionisation: electrons or ions. Those ionisation products are transported from the ionisation place to the detector using external guiding fields. Nonuniformities of these fields, space charge of the beam itself and initial velocities of the electrons due to ionisation are the main phenomena leading to distortion of the beam image. All these phenomena must be estimated using numerical simulations. During the last 40 years numerous codes were written to address various aspects of the electron/ion transport in IPMs, however none of these codes is publicly available, maintained, well documented nor completed. In this workshop an inter-labolatory collaboration with goal to create, benchmark and maintain such a code will be discussed and planned.
  • Bernd Dehning
  • Cyrille Thomas
  • Eva Barbara Holzer
  • Gerard Alain Tranquille
  • Hampus Sandberg
  • Jacques Marroncle
  • James Storey
  • Jocelyn Tan
  • Kenichiro Sato
  • Mariusz Sapinski
  • Peter Forck
  • Rahul Singh
  • Randy Thurman-Keup
  • Robert Williamson
  • Sanja Damjanovic
  • Sreban Udrea
  • Swann Louis Levasseur