Speaker
Franco MALOBERTI
(University of Pavia)
Description
Modern and future ultra-deep-submicron technologies
make challenging the analog design especially when
power consumption must match digital counterparts.
The decrease of the supply voltage reduces the voltage
headroom in analog circuits, the gate leakage current
increases, the voltage gain decreases in planar bulk
transistors, 1/f noise deteriorate when using new high-
k gate dielectrics. The transistor and passive
components mismatches give rise to large inaccuracies.
Only some of these problems can be solved at the
technology level; others require new circuit topologies
and design techniques. The increased digital processing
capability not only pushes the analog-digital interface
toward more and more digital, thus limiting the analog
design to very first interfaces and data converters, but
also enables to use digital methods for the correction
and digital assisted analog design. Several of the
solutions currently proposed for analog pre-processing
and data converter design are discussed in this paper.
Primary author
Franco Maloberti
(University of Pavia)
Co-author
Franco MALOBERTI
(University of Pavia)
