Defect and Material Characterization & New Materials
2
Results of the simultaneous investigation of the microwave probed photoconductivity and current transients in proton irradiated FZ Si pad detectors
E.Gaubas, J.Vaitkus, E.Fretwurst
Vilnius university, Hamburg university
Speaker:
Eugenijus Gaubas(Vilnius)
Slides
3
Recent results on CdZnTe and SiGe devices
A. Ruzin, I. Torchinsky, P. Litovchenko
Tel Aviv University, Institute for Nuclear research - Kiev
Speaker:
Arie Ruzin(Tel Aviv University)
Abstract
10:25
Coffee Break
4
Discussion Session (Defect and Material Characterization & New Materials)
- Report from the Hamburg Workshop
- Plan for future work
Slides
Pad Detector Characterization & Material Engineering
5
DC bias effects in CV measurements
A.Chilingarov, D.Campbell
Lancaster University, UK
Speaker:
Alexander Chilingarov(Lancaster University, UK)
Abstract
Slides
6
Effect of bias voltage on full depletion voltage measured for different materials
G.Kramberger, V. Cindro, I. Mandić, M. Mikuž
Jožef Stefan Institute, Ljubljana, Slovenia
Speaker:
Gregor Kramberger(Jozef Stefan Institute)
Abstract
Slides
12:05
Lunch break
7
Neutron irradiation effects in epitaxial silicon detectors
V. Khomenkov(*), D.Bisello(*), A. Candelori(*), V. Cindro
(**), A. Litovchenko(*), D. Pantano(*)
(*) INFN Padua Section and University of Padua, Italy
(**) Jožef Stefan Institute, Ljubjana, Slovenia
Speaker:
Vladimir Khomenkov(INFN)
Abstract
Slides
8
Recent results of measurements performed on irradiated epitaxial and MCz silicon devices of the SMART Collaboration
M. Boscardin, L. Borrello, M. Bruzzi, D. Creanza, G.F.
Dalla Betta, V. Eremin, A. Macchiolo, N. Manna, D.
Menichelli, A. Messineo, C. Piemonte, V. Radicci, M.
Scaringella, C. Tosi, E. Verbitskaya, N. Zorzi
Speaker:
Anna Macchiolo
Slides
9
Homogeneity and thermal donors in p-type MCz-Si detector materials
Panja Luukka et al.
Helsinki Institute of Physics
Speaker:
Panja Luukka(Helsinki)
Slides
10
CCE and CV/IV measurements and annealing studies with irradiated p-type MCz diodes
H. Hoedlmoser, M. Moll, M. Koehler, H. Nordlund
CERN, University Siegen, Helsinki Institute of Physics
Speaker:
Herbert Hoedlmoser
Abstract
Slides
11
Charge collection in p- and n-type MCz Si microstrip and single pad SMART detectors irradiated with 26MeV protons
Monica Scaringella, Carlo Tosi, Anna Macchiolo, David
Menichelli, Mara Bruzzi, H. F. W. Sadrozinski, M. K.
Petterson, C. Betancourt, A. Messineo, L. Borrello, N.
Manna, D. Creanza
INFN Florence, University of Florence, SCIPP, INFN Pisa,
University of Bari
Speaker:
Monica Scaringella(INFN, University of Florence)
Slides
15:10
Coffee Break
12
Modeling Radiation Damage Effects in Oxygenated Silicon Detectors
M. Petasecca (1,2), G. Caprai (1), G.U. Pignatel (1,2), D.
Passeri (1,2)
(1) University of Perugia, via G.Duranti 93 - 06125
Perugia ITALY (2) INFN sez. Perugia, via Pascoli 10 –
06120 Perugia ITALY
Speaker:
Marco Petasecca(University of Perugia - DIEI)
Abstract
Slides
13
Electric field distribution in irradiated MCZ Si detectors
E. Verbitskaya et al.
Speaker:
Elena Verbitskaya(Ioffe)
Slides
14
Recent results on electric field distribution in SMART irradiated detectors on MCZ and epitaxial silicon
V. Eremin et al.
Speaker:
Vladimir Eremin(Ioffe)
Slides
15
Measurements of Lorentz angle in irradiated silicon strip sensors
J. Bol, W. de Boer, A. Furgeri, F. Hauler, M. Krause, S.
Mueller, S. Reinhardt, A. Sabellek
Institut für Experimentelle Kernphysik, University of
Karlsruhe
Speaker:
Michael Krause(University of Karlsruhe)
Abstract
Slides
16
Discussion Session (Pad Detector Characterization & Material Engineering)
Discussion Session (3D detectors and New Structures)
Full Detector Systems
10:10
coffee break
21
Absolute charge measurements using laser setup.
Peter Kodys and Prague group
Charles University
Speaker:
Peter Kodys(Prague)
Slides
22
Negative charge measurements with ATLAS SCT readout HW and SW.
Peter Kodys and Prague group
Charles University
Speaker:
Peter Kodys(Charles University, Prague)
Slides
23
Annealing of TID radiation effects in SMART SSD, MOS and Capacitance test structures
H. F.-W. Sadrozinski, C. Betancourt, R. Heffern, I.
Henderson, J. Pixley, A. Polyakov, M. Wilder M.
Boscardin, C. Piemonte, A. Pozza,N. Zorzi, G.-F. Dalla
Betta
UC Santa Cruz, ITC-irst, Univ. of Trento
Speaker:
Hartmut Sadrozinski(SCIPP)
Slides
24
Gamma and Neutron Radiation Hardness Tests on 3 different SiGe IHP Technologies for S-LHC
S. Díez, M. Ullán, F. Campabadal, M. Lozano, G.
Pellegrini
CNM - Barcelona
Speaker:
Sergio Díez(CNM - Barcelona)
Slides
25
Charge collection of p-type detectors irradiated with neutrons
C. Lacasta S. Martí, G. Pellegrini, F.Campabadal,
C.Escobar, C. García, M. Miñano, M. Lozano, J.M. Rafi,
M.Ullan
IFIC-Valencia CNM-IMB