Speaker
Description
The degradation in critical temperature of REBCO coated conductors has been attributed to the generation of point defects, particularly on the oxygen sublattice. This introduces substantial challenges for observing the defects directly because the low mass oxygen atoms are not visible in the most widely used atomic resolution electron microscopy technique, high angle annular dark field imaging (HAADF). Therefore, alternative techniques are required to probe the oxygen defects. Here I will introduce a range of state of the art spectroscopy and microscopy techniques that we have found are sensitive to the point defect damage in REBCO, including high energy resolution x-ray absorption spectroscopy, Raman spectroscopy and electron ptychography.
