13th "Trento" Workshop on Advanced Silicon Radiation Detectors

Effect of thinning and backplane processing on charge collection properties of irradiated CMOS

20 Feb 2018, 12:45

15m

Max-Planck-Institut für Physik, Munich

CMOS sensors

Speaker

Marko Mikuz (Jozef Stefan Institute (SI))

Presentation materials

Trento_2018-CMOS_MM.pdf