09:00
|
Planar pixel sensors (I)
-
Daniel Muenstermann
(Lancaster University (GB))
(until 10:15)
|
09:00
|
FBK-INFN-LPNHE thin n-on-p pixel detectors: beamtest results
-
Audrey Ducourthial
(Centre National de la Recherche Scientifique (FR))
|
09:15
|
CMS Pixel detector development for the HL-LHC with first results for HPK prototype sensors
-
Georg Steinbrueck
(Hamburg University (DE))
|
09:30
|
New approaches to HEP sensors at CiS
-
Arno Kompatcher
(CIS )
|
09:45
|
Compilation of the results on characterization of ADVACAM edgeless pixel sensors
-
Dmytro Hohov
(Université Paris-Saclay (FR))
|
10:00
|
Development of N-on-P planar technology at SINTEF MiNaLab
- Dr
Marco Povoli
(SINTEF MiNaLab)
|
10:15
|
Coffe Break
(until 10:45)
|
10:45
|
Planar pixel sensors (II)
-
Daniel Muenstermann
(Lancaster University (GB))
(until 11:15)
|
10:45
|
Studies of the MaPSA-light Module for the CMS Phase II Upgrade
-
Kevin Connor Nash
(Rutgers State Univ. of New Jersey (US))
|
11:00
|
Research and development of new radiation tolerant pixel Silicon sensors for the high-luminosity
-
Davide Zuolo
(Universita & INFN, Milano-Bicocca (IT))
|
11:15
|
CMOS sensors
-
Dominik Dannheim
(CERN)
(until 13:00)
|
11:15
|
Radiation-hard passive CMOS-sensors
-
David-Leon Pohl
(University of Bonn (DE))
|
11:30
|
Recent developments on monolithic CMOS pixel sensors in TowerJazz 180nm technology
-
Christian Riegel
(Bergische Universitaet Wuppertal (DE))
|
11:45
|
Performance of the H35DEMO chip monolithic matrices before and after irradiation
-
Stefano Terzo
(IFAE Barcelona (ES))
|
12:00
|
Characterization of H35 HV-CMOS Sensors before and after Proton Irradiation
-
D M S Sultan
(Universite de Geneve (CH))
|
12:15
|
Depleted monolithic CMOS pixels using column drain readout for the ATLAS Inner Tracker
-
Tianyang Wang
(University of Bonn (DE))
|
12:30
|
E-TCT characterisation of irradiated backside biased H35DEMO pixel demonstrators
- Mr
Matthew Franks
(University of Liverpool)
|
12:45
|
Effect of thinning and backplane processing on charge collection properties of irradiated CMOS
-
Marko Mikuz
(Jozef Stefan Institute (SI))
|