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The first part of the work is devoted to the study of the performance of active and slim edge ATLAS planar pixel sensors (PPS) in various test conditions including irradiation fluences (1e15 and 2e15 n$_{eq}$cm$^2$ ) and sensor inclination. For the performing of testbeam measurements CERN and DESY beam facilities have been used.
In the second part of the present work another method to characterize the PPS is described. This method uses an infrared laser and gives a possibility to characterize the PPS in situ before going to testbeam facilities. Using a laser we get the very flexible charge injection with well-defined hit position. The laser test bench setup is developing in the clean room at LAL (Orsay). Current status of the laser test bench setup and the first results are presented in this work.