Feb 19 – 21, 2018
Max-Planck-Institut für Physik, Munich
Europe/Zurich timezone

Compilation of the results on characterization of ADVACAM edgeless pixel sensors

Not scheduled
15m
Max-Planck-Institut für Physik, Munich

Max-Planck-Institut für Physik, Munich

Max-Planck-Institut für Physik (Werner-Heisenberg-Institut) Föhringer Ring 6 80805 München

Speaker

Dmytro Hohov (Université Paris-Saclay (FR))

Description

The first part of the work is devoted to the study of the performance of active and slim edge ATLAS planar pixel sensors (PPS) in various test conditions including irradiation fluences (1e15 and 2e15 n$_{eq}$cm$^2$ ) and sensor inclination. For the performing of testbeam measurements CERN and DESY beam facilities have been used.
In the second part of the present work another method to characterize the PPS is described. This method uses an infrared laser and gives a possibility to characterize the PPS in situ before going to testbeam facilities. Using a laser we get the very flexible charge injection with well-defined hit position. The laser test bench setup is developing in the clean room at LAL (Orsay). Current status of the laser test bench setup and the first results are presented in this work.

Primary authors

Dmytro Hohov (Université Paris-Saclay (FR)) Abdenour Lounis (Université Paris-Saclay (FR)) Dimitris Varouchas (Centre National de la Recherche Scientifique (FR), LAL-Orsay)

Presentation materials

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