Speaker
Hartmut Sadrozinski
(University of California,Santa Cruz (US))
Description
The performance of Ultra-fast Silicon Detectors (UFSD) has been measured pre-rad and after neutron irradiation up to 6e15 n/cm^2.
Of special interest are UFSD with 35 and 50 micron thickness.
The measured time resolution is traced back to the evolution with fluence of internal gain, rise time and noise.
Primary author
Hartmut Sadrozinski
(University of California,Santa Cruz (US))