Speaker
Nicolo Cartiglia
(INFN Torino)
Description
In this presentation, I will report on a study of the onset of shot noise in irradiated LGAD sensors. High fluence generates high current, which leads to large shot noise. However, most of the leakage current measured in irradiated sensors does not contribute significantly to the noise, indicating that is collected without multiplication. We will show the strong relationship between noise and gain, and current and bias voltage.
Primary author
Nicolo Cartiglia
(INFN Torino)
