Speaker
Dr
David Flores
(Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))
Description
In this talk, we will present some technological capabilities that could be of interest for the RD50 community. In this sense, the first results from new PiN diodes integrated on 6-inch N-silicon wafers will be shown. To perform this 6-inch technological process we have upgraded the standard CNM 4-inch process to the new wafer size. Additionally, we will describe the works performed to increase the layout edition capabilities to achieve a full-sensor automatic layout generation using Python. Finally, we will present a description of the technological and electrical characterization resources for silicon detectors at our labs, in particular we will explain our Reverse Engineering procedures that allow a deeper insight on the physical and geometrical properties of the fabricated devices.
Author
Dr
David Flores
(Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))
Co-authors
Dr
David Quirion
(Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))
Dr
Giulio Pellegrini
(Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))
Dr
Miguel Ullan Comes
(Instituto de Fisica Corpuscular (ES))
Dr
Pablo Fernandez-Martinez
(Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))
Dr
Salvador Hidalgo
(Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))
Dr
Virginia Greco
(Instituto de Microelectronica de Barcelona (IMB-CNM-CSIC))
