25–30 Sept 2016
La Biodola, Isola d'Elba, Italy
Europe/Rome timezone

Wire-bonding and Assembly Studies for the Outermost Layer of Silicon Vertex Detector in the Belle-II experiment

27 Sept 2016, 18:00
1h 30m
La Biodola, Isola d'Elba, Italy

La Biodola, Isola d'Elba, Italy

Speakers

Hyebin Jeon (On behalf of Belle-II SVD Collaboration)Mr Kookhyun Kang (Kyungpook National Universiy)

Description

The vertex detector (VXD) for the Belle-II experiment, at the Super-KEKB in Japan, measures precisely information of vertexing and tracking. The VXD consists of a pixel detector (PXD) and a silicon vertex detector (SVD) with two and four layers, respectively, so that operates under a high luminosity environment of the Belle-II experiment. For the SVD, a novel chip-on-sensor concept, called “Origami”, is developed to reduce the multiple Coulomb scattering and capacitive noise. A wire-bonding and assembly procedures for the outermost layer of the SVD have been studied. A wire-bonding study especially for the Origami module has been performed. As changing the bonding parameters, we measure pull-forces to break the wires by pulling them and observe shape types of broken wires and bond foot prints. In addition, an issue on position precision of a tilted DSSD is found, and a shim method has been employed and studied to improve mechanical precision of the DSSD. In this paper, we present the results of wire-bonding study and introduce the shim method to solve the problem of the tilted sensor during the assembly procedures.

Authors

Hwanbae Park (Kyungpook National University) Hyebin Jeon (On behalf of Belle-II SVD Collaboration) Mr Kookhyun Kang (Kyungpook National Universiy)

Co-authors

Bobae Kim (Kyungpook National university) Changwoo Joo (IPMU (Tokyo Univ)) Dr Kameswara Rao KODALI (Tata Institute of Fundamental Research) Dr Takeo Higuchi (Kavli IPMU) Dr Tomoko Morii (Kavli IPMU) Mr Toshiki Yoshinobu (Niigata University) Dr Yoshiyuki Onuki (University of Tokyo)

Presentation materials