13th "Trento" Workshop on Advanced Silicon Radiation Detectors

Session

CMOS sensors

20 Feb 2018, 11:15

Max-Planck-Institut für Physik, Munich

Conveners

CMOS sensors: :

• Dominik Dannheim (CERN)

77. Radiation-hard passive CMOS-sensors

David-Leon Pohl (University of Bonn (DE))

20/02/2018, 11:15

85. Recent developments on monolithic CMOS pixel sensors in TowerJazz 180nm technology

Christian Riegel (Bergische Universitaet Wuppertal (DE))

20/02/2018, 11:30

80. Performance of the H35DEMO chip monolithic matrices before and after irradiation

Stefano Terzo (IFAE Barcelona (ES))

20/02/2018, 11:45

78. Characterization of H35 HV-CMOS Sensors before and after Proton Irradiation

D M S Sultan (Universite de Geneve (CH))

20/02/2018, 12:00

79. Depleted monolithic CMOS pixels using column drain readout for the ATLAS Inner Tracker

Tianyang Wang (University of Bonn (DE))

20/02/2018, 12:15

82. E-TCT characterisation of irradiated backside biased H35DEMO pixel demonstrators

Mr Matthew Franks (University of Liverpool)

20/02/2018, 12:30

81. Effect of thinning and backplane processing on charge collection properties of irradiated CMOS

Marko Mikuz (Jozef Stefan Institute (SI))

20/02/2018, 12:45