June 27, 2021 to July 1, 2021
Europe/Brussels timezone

Electron detection with CdTe and GaAs sensors using the charge integrating hybrid pixel detector JUNGFRAU

Jun 28, 2021, 11:40 AM
Zoom (Online)



Oral presentation Sensor Materials, Device Processing & Technologies Oral presentations


Erik Fröjdh (Paul Scherrer Institut)


JUNGFRAU is a charge integrating hybrid pixel detector developed for use at X-ray free electron lasers. With in pixel gain switching it provides single photon sensitivity down to 2 keV while maintaining a dynamic range of 120 MeV. The pixel size is 75 x 75 $\mu m^2$ and the largest detector currently in use has 16M pixels. The characteristics of Jungfrau makes it an interesting detector for electron detection, capable of both providing information about the energy deposition of single electrons, in the low flux regime as well as measuring very high fluxes, for example in diffraction experiments, due to the charge integrating architecture. Exploiting the possibility to acquire per pixel information on energy deposition and leakage current it also is a useful tool for sensor characterization.

While Silicon sensors coupled to hybrid pixel detectors show good results up to ~100 keV [1, 2], at higher electron energies multiple scattering in the sensor layer reduces the spatial resolution. One strategy to mitigate this is to use a high Z sensor material which gives a shorter track of the primary electron. In this work we compare Si, GaAs and CdTe sensors bump bonded to JUNGFRAU and present results on energy resolution, cluster size and modular transfer function. The measurements were carried out using a 300 keV FEI Tecnai G2 Polara microscope at 100, 200 and 300 keV. We also compare the results to simulations done in Geant4.

[1] J. Mir, R. Clough, R. MacInnes, C. Gough, R. Plackett, I. Shipsey, H. Sawada, I. MacLaren, R. Ballabriga, D. Maneuski, V. O’Shea, D. McGrouther, A. Kirkland, Characterisation of the Medipix3 detector for 60 and 80 keV electrons, Ultramicroscopy 182 (2017) 44–53.

[2] G. Tinti, E. Fröjdh, E. van Genderen, T. Gruene, B. Schmitt, D. A. M. de Winter, B. M. Weckhuysen, J. P. Abrahams, Electron crystallography with the EIGER detector, IUCrJ 5 (2) (2018) 190–199.

Primary authors

Erik Fröjdh (Paul Scherrer Institut) Prof. Jan Pieter Abrahams (Paul Scherrer Institut) Marie Andrä (PSI - Paul Scherrer Institut) Rebecca Barten (Paul Scherrer Institut) Anna Bergamaschi (PSI) Martin Brückner (PSI - Paul Scherrer Institut) Sabina Chiriotti Alvarez (PSI - Paul Scherrer Institut) Roberto Dinapoli (Paul Scherrer Institut) Dominic Greiffenberg (PSI - Paul Scherrer Institute) Dr Viktoria Hinger (Paul Scherrer Institut) L. Lovacik (C-CINA) for Biozentrum, University of Basel, Switzerland) Thomas King (Paul Scherrer Institut) Pawel Kozlowski (PSI - Paul Scherrer Institut) Carlos Lopez-Cuenca (Paul Scherrer Institute) Markus Jürgen Meyer (PSI - Paul Scherrer Institut) Davide Mezza (Paul Scherrer Institut) Aldo Mozzanica (PSI - Paul Scherrer Institut) Christian Ruder (Paul Scherrer Institut) Bernd Schmitt (Paul Scherrer Institut) Shqipe Hasanaj (Paul Scherrer Institut) Dhanya Thattil (Paul Scherrer Institut) Eric van Genderen (PSI) Seraphin Vetter (Paul Scherrer Institut) Jiaguo Zhang (Paul Scherrer Institut)

Presentation materials