27 June 2021 to 1 July 2021
Online
Europe/Brussels timezone

Multi-threshold Window Discriminator Based on SAR Logic

Not scheduled
20m
Gather.town (Online)

Gather.town

Online

Poster presentation only Front end electronics and readout Poster session 2

Speaker

Jakub Jirsa (Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague, Czech Republic, Faculty of Electrical Engineering Czech, Technical University in Prague, Czech Republic )

Description

The new class of X-ray imaging detectors allows us to capture an image in various energy ranges in one shot [1]. This technique is called X-ray color imaging, and it is becoming a promising method in many applications such as medical imaging, computed tomography, and material testing [2]. To measure the energy spectrum in one shot, discriminant circuits need to be integrated into the pixel front-end electronics. Several solutions of in-pixel discriminators exist. However, current designs suffer from a low number of discrimination bins and need to adjust each discrimination threshold separately, leading to relatively complicated calibration procedures [3].

This work will introduce a novel design of a multi-threshold window discriminator based on successive approximation register logic. This circuit realizes in-pixel binning to ten equidistant windows. Two variables are used for tuning the multi-threshold window discriminator: offset of first window and width of windows. Setting these parameters allows the user to fulfill the need for the target application. The results will be presented.

[1] M. C. Veale, et al., Synchrotron Radiat. News, 31 (2018), 28–32
[2] J. P. Ronaldson, et al., IEEE Nuclear Science Symposium Conference Record, (2011)
[3] R. Ballabriga, et al., Journal of Instrumentation, 8 (2013), no. 2,

Primary authors

Jakub Jirsa (Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague, Czech Republic, Faculty of Electrical Engineering Czech, Technical University in Prague, Czech Republic ) Miroslav Havranek (Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague, Czech Republic, Faculty of Electrical Engineering Czech, Technical University in Prague, Czech Republic ) Michal Marcisovsky (Czech Academy of Sciences (CZ),Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague, Czech Republic, Faculty of Electrical Engineering Czech, Technical University in Prague, Czech Republic ) Dr Jakovenko Jiri (Faculty of Electrical Engineering Czech, Technical University in Prague, Czech Republic)

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