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Description
HYLITE is a charge-integration pixel detector readout chip designed for Shanghai high repetition rate XFEL and extreme light facility. With a dynamic range t of 1~10000 photons at 12 keV, the pixel of HYLITE includes an ADC with an automatic gain-switching function. The initial phase of HYLITE development focuses on creating a 64×64-pixel chip with a 200-μm pixel pitch. The ultimate goal is to produce a chip with 128×128 pixels and a 100-μm pixel pitch.
HYLITE200F, the first full-scale chip of HYLITE, was manufactured using a 130 nm CMOS process. The frame rate of HYLITE200F is 6 kHz in successive readout mode, with plans to enhance it to 12 kHz in the final version. Moreover, HYLITE200F is bump-bonded with a specially designed PIN sensor for joint debugging. The test module comprises four HYLITE200F chips and one sensor and underwent preliminary testing using an X-ray tube. The test results demonstrate that the module can produce images clearly after flat-field correction.
| Alternate track | 13. Detectors for Future Facilities, R&D, Novel Techniques |
|---|---|
| I read the instructions above | Yes |
